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A Parametrical Model for Instance-Dependent Label Noise

Yang, S; Wu, SH; Yang, E; Han, B; Liu, Y; Xu, M; Niu, G; Liu, TL

Xu, M (通讯作者),Univ Technol Sydney, Sch Elect & Data Engn, Fac Engn & Informat Technol, Ultimo, NSW 2007, Australia.

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2023; 45 (12): 14055

Abstract

In label-noise learning, estimating the transition matrix is a hot topic as the matrix plays an important role in building statistically consistent cl......

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