Baidu
map
GetToolImpactFactorPageRequest(projectId=1, fullname=null, names=null, oldNames=null, impactFactorMin=null, impactFactorMax=null, sortName=null, sortType=null, tagName=65671, tagId=null, bigClassId=null, smallClassId=null, bigclass=null, smallclass=null, source=1, isHighlight=0, categoryId=null, excludeIds=null, categoryIds=null, type=sci, updatedTimeMax=null, updatedTimeMin=null) [GetPortalToolImpactFactorPageResponse(id=2f3112850, projectId=1, cover=https://img.medsci.cn/images/journal/cover/2021/tXr_202109271315136100.jpg, name=IEEE Access, abbr=IEEE ACCESS, fullname=IEEE Access, cnname=IEEE访问, medsciHotlight=28.696, hindex=127, impactFactor=3.9, articleNumbers=61429, acceptanceRate=null, issn=2169-3536, eissn=2169-3536, submissionToAcceptance=null, impactFactorTags=[ImpactFactorTagRequest(createdHits=2, id=25723, tagName=计算机), ImpactFactorTagRequest(createdHits=1, id=65671, tagName=电气工程), ImpactFactorTagRequest(createdHits=1, id=65672, tagName=电信)], impactFactorSpeed=null, pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=IEEE Access[ta], greenSci=https://www.greensci.net/search?kw=2169-3536, scijournal=https://www.scijournal.org/impact-factor-of-IEEE-ACCESS.shtml), GetPortalToolImpactFactorPageResponse(id=1dbd3007, projectId=1, cover=https://img.medsci.cn/images/journal/cover/2021/ibJ_202109271315154370.jpg, name=IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, abbr=IEEE T IND ELECTRON, fullname=IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, cnname=汇刊工业电子 ITIE, medsciHotlight=7.62, hindex=287, impactFactor=7.7, articleNumbers=11720, acceptanceRate=null, issn=0278-0046, eissn=1557-9948, submissionToAcceptance=null, impactFactorTags=[ImpactFactorTagRequest(createdHits=1, id=41463, tagName=工程与材料), ImpactFactorTagRequest(createdHits=1, id=54626, tagName=电力电子学), ImpactFactorTagRequest(createdHits=1, id=54627, tagName=电气科学与工程)], impactFactorSpeed=null, pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS[ta], greenSci=https://www.greensci.net/search?kw=0278-0046, scijournal=https://www.scijournal.org/impact-factor-of-IEEE-T-IND-ELECTRON.shtml)] 2 <span class='page-info-left'>共2条</span><a class='prev page-numbers no-allow' href='javascript:;'>首页</a><a class='prev page-numbers no-allow' href='javascript:;'><i class='fa fa-angle-double-left'></i>上一页</a><a class='next page-numbers no-allow' href='javascript:;'>下一页<i class='fa fa-angle-double-right'></i></a><a class='next page-numbers no-allow' href='javascript:;'>尾页</a><span class='page-info-right'>页码: <span class='page-now'>1</span>/1页</span><span class='page-info-right'>10条/页</span> 高级检索 共查询到2条结果
年文章数 MedSci 指数 JIF JIF上升速度
IEEE ACCESS
IEEE ACCESS

IEEE Access

MI:28.696 H指数:127 影响指数:3.9 年文章数:61429

投稿命中率: 开通期刊会员,数据随心看 审稿周期: 开通期刊会员,数据随心看

计算机 电气工程 电信

进入期刊论坛
IEEE T IND ELECTRON
IEEE T IND ELECTRON

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

MI:7.62 H指数:287 影响指数:7.7 年文章数:11720

投稿命中率: 开通期刊会员,数据随心看 审稿周期: 开通期刊会员,数据随心看

工程与材料 电力电子学 电气科学与工程

进入期刊论坛
共2条页码: 1/1页10条/页
Baidu
map
Baidu
map
Baidu
map