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Total Dose Radiation Response of Capacitance Characteristic for Nano-scale NMOS

Liao, CG; Yang, YT; Zhu, ZM; Hao, MR

Hao, MR (corresponding author), Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Device, Xian 710071, Shaanxi, Peoples R China.

IETE JOURNAL OF RESEARCH, 2021; 67 (4): 532

Abstract

The carrier transport in uniaxial strained Si N channel metal oxide semiconductor field effect transistor (NMOSFET) irradiated by gamma rays is analys......

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