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Structured light scanning artifact-based performance study

Jacobs, L; Dvorak, J; Cornelius, A; Zameroski, R; No, T; Schmitz, T

Schmitz, T (通讯作者),Oak Ridge Natl Lab, Mfg Demonstrat Facil, 2350 Cherahala Blvd, Knoxville, TN 37932 USA.

MANUFACTURING LETTERS, 2023; 35 (): 873

Abstract

Structured light scanning is used to create a digital twin of a manufactured part, where features are extracted to determine if the part meets the des......

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