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Pulsed Force Kelvin Probe Force Microscopy

Jakob, DS; Wang, HM; Xu, XJG

Xu, XJG (corresponding author), Lehigh Univ, Dept Chem, Bethlehem, PA 18015 USA.

ACS NANO, 2020; 14 (4): 4839

Abstract

Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surfa......

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