Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network-MedSci.cn - 梅斯（MedSci）

Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network

Yang, YF; Sun, M

Yang, YF (通讯作者)，Natl Tsing Hua Univ, Int Intercollegiate PhD Program, Hsinchu 300044, Taiwan.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2022; 35 (1): 16

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