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Identification and Sensing of Wear Debris Caused by Fretting Wear of Electrical Connectors

Luo, YY; Zhang, ZP; Wu, XW; Su, JY

Luo, YY (corresponding author), Hebei Univ Technol, State Key Lab Reliabil & Intelligence Elect Equip, Tianjin, Hebei, Peoples R China.; Luo, YY (corresponding author), Hebei Univ Technol, Key Lab Electromagnet Field & Elect Apparat Relia, Tianjin, Peoples R China.

IEICE TRANSACTIONS ON ELECTRONICS, 2020; E103C (5): 246

Abstract

An electrical capacitance tomography (ECT) method was used to detect fretting wear behavior of electrical connectors. The specimens used in this study......

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