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Dual-wavelength interferometry based on dispersion

Chai, YM; Zhao, WR

Zhao, WR (通讯作者),Beijing Inst Technol, Sch Opt & Photon, Beijing Key Lab Precis Optoelect Measurement Inst, Beijing 100081, Peoples R China.

OPTICAL DESIGN AND TESTING XII, 2023; 12315 ():

Abstract

Interferometry is commonly used for an optical element surface accurate test. But the testing dynamic range is affected by the ambiguity of 2 pi. To s......

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