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Process Variation Based Electrical Model of STT-Assisted VCMA-MTJ and Its Application in NV-FA

Jin, DY; Cao, LM; Wang, Y; Jia, XX; Pan, YA; Zhou, YX; Lei, X; Liu, YY; Yang, YQ; Zhang, WR

Zhang, WR (通讯作者),Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China.

IEICE TRANSACTIONS ON ELECTRONICS, 2022; E105C (11): 704

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