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Ensemble-Based Out-of-Distribution Detection

Yang, D; Ngoc, KM; Shin, I; Lee, KH; Hwang, M

Hwang, M (corresponding author), Univ Sci & Technol, Dept Data & HPC Sci, Daejeon 34113, South Korea.; Hwang, M (corresponding author), Korea Inst Sci & Technol Informat, Dept Intelligent Infrastruct Technol Res, Daejeon 34141, South Korea.

ELECTRONICS, 2021; 10 (5):

Abstract

To design an efficient deep learning model that can be used in the real-world, it is important to detect out-of-distribution (OOD) data well. Various ......

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