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Dual-energy approach to reduce cone-beam artefacts in a circular orbit cone-beam CT system

Han, C; Baek, J

Baek, J (corresponding author), Yonsei Univ, Sch Integrated Technol, Incheon 406840, South Korea.; Baek, J (corresponding author), Yonsei Univ, Yonsei Inst Convergence Technol, Incheon 406840, South Korea.

ELECTRONICS LETTERS, 2020; 56 (13): 648

Abstract

The authors propose a dual-energy approach to reduce cone-beam artefacts in a circular orbit cone-beam computed tomography (CT) system. When there exi......

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