The Research on Screening Method to Reduce Chip Test Escapes by Using Multi-Correlation Analysis of Parameters-MedSci.cn - 梅斯（MedSci）

The Research on Screening Method to Reduce Chip Test Escapes by Using Multi-Correlation Analysis of Parameters

Zhang, JL; You, HL; Jia, RX; Wang, XW

You, HL (通讯作者)，Xidian Univ, Key Lab Wide Bandgap Semicond Mat, Xian 710071, Peoples R China.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2022; 35 (2): 266

科室
- - 订阅+
  - 更多科室
工具
服务