Wafer Bin Map Recognition With Autoencoder-Based Data Augmentation in Semiconductor Assembly Process-MedSci.cn - 梅斯（MedSci）

Wafer Bin Map Recognition With Autoencoder-Based Data Augmentation in Semiconductor Assembly Process

Shen, PC; Lee, CY

Lee, CY (通讯作者)，Natl Taiwan Univ, Dept Informat Management, Taipei 10617, Taiwan.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2022; 35 (2): 198

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