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New method and system of automatically moving a CMM probe tip into holes with submillimeter diameter and high aspect ratio

Cheng, ZY; Luan, H; Sun, Y; Li, RJ; Li, HL; Pan, QS; Huang, QX

Li, RJ (corresponding author), Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Peoples R China.

JOURNAL OF INSTRUMENTATION, 2021; 16 (6):

Abstract

The demand of measuring the internal topography of holes with submillimeter diameter and high aspect ratio is increasing. However, moving a coordinate......

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