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Field degradation modeling and prognostics under time-varying operating conditions: A Bayesian based filtering algorithm

Li, SZ; Yang, ZJ; Chen, CH; Yu, CM; Tian, HL; Jin, TT

Chen, CH (corresponding author), Minist Educ, Key Lab CNC Equipment Reliabil, Changchun 130025, Jilin, Peoples R China.

APPLIED MATHEMATICAL MODELLING, 2021; 99 (): 435

Abstract

In practice, degradation modeling and prognostics for a product working in field is of im-portance for condition-based maintenance, meanwhile a challe......

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