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Fault recognition based test score for improving the accuracy of defect diagnosis

Tian, NY; Ouyang, DT; Song, JC; Zhang, LM

Zhang, LM (corresponding author), Jilin Univ, Coll Comp Sci & Technol, Changchun, Peoples R China.; Zhang, LM (corresponding author), Minist Educ, Key Lab Symbol Computat & Knowledge Engn, Changchun, Peoples R China.

ELECTRONICS LETTERS, 2021; 57 (15): 597

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