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Extended Hencky solution for the blister test of nanomembrane

Ma, Y; Wang, GR; Chen, YL; Long, D; Guan, YC; Liu, LQ; Zhang, Z

Chen, YL (reprint author), Beihang Univ, Inst Solid Mech, Beijing 100191, Peoples R China.; Liu, LQ; Zhang, Z (reprint author), Chinese Acad Sci, Key Lab Nanosyst & Hierarch Fabricat, Natl Ctr Nanosci & Technol, Ctr Excellence Nanosci, Beijing 100190, Peo

EXTREME MECHANICS LETTERS, 2018; 22 (): 69

Abstract

The blister test has been extensively used as a simple and effective approach to measure the elastic modulus and the interface adhesion energy of two-......

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