Baidu
map

Diagnostic Test Generation That Addresses Diagnostic Holes

Pomeranz, I

Pomeranz, I (reprint author), Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA.

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019; 38 (2): 335

Abstract

A diagnostic test generation procedure targets fault pairs in a set of target faults with the goal of distinguishing all the fault pairs. When a fault......

Full Text Link


Baidu
map
Baidu
map
Baidu
map