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The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures

Chen, XM; Sun, XY; Wang, PN; Datta, S; Hu, XS; Yin, XZ; Jerry, M; Yu, SM; Laguna, AF; Ni, K; Niemier, MT; Reis, D

Niemier, MT (corresponding author), Univ Notre Dame, Notre Dame, IN 46556 USA.

IEEE DESIGN & TEST, 2020; 37 (1): 79

Abstract

Editor's note: Semiconductor industry is steadily on the quest for emerging devices and device technologies that lead to higher performance and higher......

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