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A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance

Li, J; Xiao, LY; Li, HC; Cao, XB; Wang, CX

Xiao, LY (通讯作者),Harbin Inst Technol, Microelect Ctr, Harbin 150001, Peoples R China.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2022; 22 (2): 223

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