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Shape and Roughness Extraction of Line Gratings by Small Angle X-Ray Scattering: Statistics and Simulations

Reche, J; Gergaud, P; Blancquaert, Y; Besacier, M; Freychet, G

Reche, J (通讯作者),Univ Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2022; 35 (3): 425

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