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A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research

Cressa, L; Fell, J; Pauly, C; Hoang, QH; Mucklich, F; Herrmann, HG; Wirtz, T; Eswara, S

Cressa, L (通讯作者)，Luxembourg Inst Sci & Technol, Adv Instrumentat NanoAnaiyt AINA, 41 Rue Brill, L-4422 Belvaux, Luxembourg.;Cressa, L (通讯作者)，Univ Stuttgart, Inst Mat Sci, Chair Mat Phys, Heisenbergstr 3, D-70569 Stuttgart, Germany.

MICROSCOPY AND MICROANALYSIS, 2022; 28 (6): 1890

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