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Accuracy of stress measurement by Laue microdiffraction (Laue-DIC method): the influence of image noise, calibration errors and spot number

Zhang, FG; Bornert, M; Petit, J; Castelnau, O

Castelnau, O (reprint author), CNRS, PIMM, UMR 8006, Arts & Metiers ParisTech, 151 Blvd Hop, F-75013 Paris, France.

JOURNAL OF SYNCHROTRON RADIATION, 2017; 24 ( ): 802

Abstract

Laue microdiffraction, available at several synchrotron radiation facilities, is well suited for measuring the intragranular stress field in deformed ......

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