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A study of hot pixels induced by proton and neutron irradiations in charge coupled devices

Liu, BK; Li, YD; Wen, L; Zhou, D; Feng, J; Ma, LD; Zhang, X; Cai, YL; Wang, ZM; Fu, J; Guo, Q; Ma, D

Li, YD (corresponding author), Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China.; Li, YD (corresponding author), Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China.

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020; 175 (5-6): 540

Abstract

Charge coupled devices with high sensitivity and low dark current were irradiated separately by 10 MeV proton, 14 and 1 MeV neutron up to the fluences......

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