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Direct Determination of Band Gap of Defects in a Wide Band Gap Semiconductor

Yan, XX; Jin, QQ; Jiang, YX; Yao, TT; Li, X; Tao, A; Gao, CY; Chen, CL; Ma, XL; Ye, HQ

Chen, CL (通讯作者),Univ Sci & Technol China, Inst Met Res, Chinese Acad Sci, Sch Mat Sci & Engn,Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.;Chen, CL (通讯作者),Jihua Lab, Foshan 528251, Peoples R China.

ACS APPLIED MATERIALS & INTERFACES, 2022; 14 (32): 36875

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