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Quantitative analysis of compatible microstructure by electron backscatter diffraction

Chapman, M; De Graef, M; James, RD; Chen, X

Chen, X (corresponding author), Hong Kong Univ Sci & Technol, Mech & Aerosp Engn, Hong Kong, Peoples R China.

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2021; 379 (2201):

Abstract

We propose a scheme for assigning the martensite variant using electron backscatter diffraction in a martensite material that undergoes a solid-solid ......

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