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An All-MOSFET Voltage Reference-Based PUF Featuring Low BER Sensitivity to VT Variations and 163 fJ/Bit in 180-nm CMOS

Gan, PZ; Zhao, XJ; Cao, Y

Zhao, XJ (corresponding author), Shenzhen Univ, Coll Elect & Informat Engn, Shenzhen 518060, Peoples R China.

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2021; 40 (6): 1172

Abstract

In this article, a novel subthreshold voltage reference (VR)-based physical unclonable function (PUF) is presented. With two native nMOS transistors s......

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