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Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning

Yang, HY; Li, SH; Tabery, C; Lin, BQ; Yu, B

Yu, B (corresponding author), Chinese Univ Hong Kong, Dept Comp Sci & Engn, Hong Kong, Peoples R China.

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2021; 40 (7): 1464

Abstract

Layout hotpot detection is one of the main steps in modern very-large-scale-integration (VLSI) chip design. A typical hotspot detection flow is extrem......

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