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High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications

Trushkina, AV; Vasilev, AS; Serikova, MG; Anisimov, AG

Trushkina, AV (reprint author), ITMO Univ, Dept Opt Elect Devices & Syst, Kronverkskiy Pr 49, St Petersburg 197101, Russia.

AUTOMATED VISUAL INSPECTION AND MACHINE VISION II, 2017; 10334 ( ):

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