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A New Parameterization for the Rician Distribution

Nicolas, JM; Tupin, F

Tupin, F (corresponding author), Telecom Paris, Inst Polytech Paris, LTCI, F-91120 Palaiseau, France.

IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 2020; 17 (11): 2011

Abstract

The Rician distribution is widely used in SAR imagery to model the backscattering of a strong target inside a resolution cell. Nevertheless, the compu......

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