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Composing ordered sequential consistency

Lev-Ari, K; Bortnikov, E; Keidar, I; Shraer, A

Lev-Ari, K (reprint author), Technion, Viterbi Dept Elect Engn, Haifa, Israel.

INFORMATION PROCESSING LETTERS, 2017; 123 ( ): 47

Abstract

We define ordered sequential consistency (OSC), a generic criterion for concurrent objects. We show that OSC encompasses a range of criteria, from seq......

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