Xu, B; Zhang, PC; Zhu, JK; Liu, ZH; Eichler, A; Zheng, XQ; Lee, JS; Dash, A; More, S; Wu, S; Wang, YA; Jia, H; Naik, A; Bachtold, A; Yang, R; Feng, PXL; Wang, ZH
Wang, ZH (通讯作者)，Univ Elect Sci & Technol China, Inst Fundamental & Frontier Sci, Chengdu 610054, Peoples R China.;Yang, R (通讯作者)，Shanghai Jiao Tong Univ, Univ Michigan Shanghai Jiao Tong Univ Joint Inst, Shanghai 200240, Peoples R China.;Feng, PXL (通讯作者)，Univ Florida, Herbert Wertheim Coll Engn, Dept Elect & Comp Engn, Gainesville, FL 32611 USA.;Naik, A (通讯作者)，Indian Inst Sci, Ctr Nano Sci & Engn, Bangalore 560012, Karnataka, India.;Yang, R (通讯作者)，Shanghai Jiao Tong Univ, Sch Elect Informat & Elect Engn, Shanghai 200240, Peoples R China.;Wang, ZH (通讯作者)，Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Device, Chengdu 610054, Peoples R China.
ACS NANO, 2022; 16 (10): 15545
