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Photo-induced strain imaging of semiconductors

Takata, K; Nakasuji, S; Nishino, T; Osaka, R; Matsushita, Y

Takata, K (reprint author), Kansai Univ, Fac Engn Sci, Suita, Osaka 5648680, Japan.

AIP ADVANCES, 2017; 7 (4):

Abstract

This paper presents a novel method for high-resolutions imaging of band-gap energies of semiconductors. When electron-hole pairs are generated in a se......

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