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Classification From Positive and Biased Negative Data With Skewed Labeled Posterior Probability

Watanabe, S; Matsui, H

Watanabe, S (通讯作者),Shiga Univ, Grad Sch Data Sci, Shiga 5228522, Japan.

NEURAL COMPUTATION, 2023; 35 (5): 977

Abstract

The binary classification problem has a situation where only biased data are observed in one of the classes. In this letter, we propose a new method t......

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