Self-heating effect on logic performance of 6T-SRAM based on CFET device-MedSci.cn - 梅斯（MedSci）

Self-heating effect on logic performance of 6T-SRAM based on CFET device

Zhao, SH; He, YD; Liu, XY; Du, G

Du, G (通讯作者)，Peking Univ, Inst Microelect, Beijing 100871, Peoples R China.

JAPANESE JOURNAL OF APPLIED PHYSICS, 2022; 61 (SC):

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