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Effects of Total Dose Radiation on Single Event Effect of the Uniaxial Strained Si Nano NMOSFET

Hao, MR; Zhang, Y; Shao, M; Chen, GX; Wang, B

Hao, MR (corresponding author), Xian Shiyou Univ, Sch Sci, Minist Key Lab Photoelect Oil Gas Logging & Detec, Xian, Peoples R China.

IETE JOURNAL OF RESEARCH, ; ():

Abstract

The effect of total dose radiation on the single event effect of uniaxial strained Si Nano channel metal oxide semiconductor field effect transistor (......

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