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TireNet: A high recall rate method for practical application of tire defect type classification

Li, Y; Fan, BB; Zhang, WP; Jiang, ZQ

Fan, BB (corresponding author), Zhejiang Univ, Coll Comp Sci & Technol, Hangzhou 310000, Peoples R China.

FUTURE GENERATION COMPUTER SYSTEMS-THE INTERNATIONAL JOURNAL OF ESCIENCE, 2021; 125 (): 1

Abstract

Tire enterprises often use X-ray photographs to inspect tire defects, which is still in the stage of manual inspection. Existing methods have achieved......

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