Study on high power microwave nonlinear effects and degradation characteristics of C-band low noise amplifier-MedSci.cn - 梅斯（MedSci）

Study on high power microwave nonlinear effects and degradation characteristics of C-band low noise amplifier

Li, FX; Chai, CC; Wu, H; Lei, L; Liang, QS; An, Q; Yang, YT

Li, FX (通讯作者)，Xidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Peoples R China.

MICROELECTRONICS RELIABILITY, 2022; 128 ():

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