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Redox-controlled conductance of polyoxometalate molecular junctions

Huez, C; Guerin, D; Lenfant, S; Volatron, F; Calame, M; Perrin, ML; Proust, A; Vuillaume, D

Vuillaume, D (通讯作者),Univ Lille, Inst Elect Microelect & Nanotechnol IEMN, CNRS, Av Poincare, Villeneuve Dascq, France.

NANOSCALE, 2022; 14 (37): 13790

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