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Plenoptic background oriented schlieren imaging

Klemkowsky, JN; Fahringer, TW; Clifford, CJ; Bathel, BF; Thurow, BS

Klemkowsky, JN (reprint author), Auburn Univ, Auburn, AL 36849 USA.

MEASUREMENT SCIENCE AND TECHNOLOGY, 2017; 28 (9):

Abstract

The combination of the background oriented schlieren (BOS) technique with the unique imaging capabilities of a plenoptic camera, termed plenoptic BOS,......

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