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Extended-Sampling-Bayesian Method for Limited Aperture Inverse Scattering Problems

Li, ZX; Deng, ZL; Sun, JG

Deng, ZL (corresponding author), Univ Elect Sci & Technol China, Sch Math Sci, Chengdu 611731, Peoples R China.

SIAM JOURNAL ON IMAGING SCIENCES, 2020; 13 (1): 422

Abstract

Limited aperture inverse scattering problems arise in many important applications. In this paper, we propose a new method combining the extended sampl......

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