Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs-MedSci.cn - 梅斯（MedSci）

Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs

Shivakumar, V; Senthilpari, C; Yusoff, Z

Shivakumar, V (通讯作者)，Multimedia Univ, Fac Engn, Jalan Multimedia, Cyberjaya 63100, Selangor, Malaysia.

MICROELECTRONICS JOURNAL, 2022; 124 ():

科室
- - 订阅+
  - 更多科室
工具
服务