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Cross-layer inference methodology for microarchitecture-aware fault models

Alshaer, I; Colombier, B; Deleuze, C; Maistri, P; Beroulle, V

Alshaer, I (通讯作者),Univ Grenoble Alpes, Grenoble INP, LCIS, Inst Engn, F-26000 Valence, France.

MICROELECTRONICS RELIABILITY, 2022; 139 ():

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