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Conductor Surface Roughness-dependent Gas Conduction Process for HVDC GIL-Part II: Experiment

Li, CAY; Zhang, L; Wang, Y; Yu, D; Wang, ZM; Zhang, ZS; Connelly, L; Lin, CJ; Chen, G; Mazzanti, G; Zhang, YX; Tschentscher, M

Wang, Y (corresponding author), Shanghai Univ Elect Power, Sch Elect Engn, Shanghai, Peoples R China.

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2021; 28 (3): 988

Abstract

In this paper, an electric field ranging from 0.44-5.24 kV/mm was applied to a gas-insulated line (GIL) model filled with SF6 at different values of g......

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