Abstract
Ortlepp, I; Stauffenberg, J; Krotschl, A; Dontsov, D; Zollner, JP; Hesse, S; Reuter, C; Strehle, S; Frohlich, T; Rangelow, IW; Manske, E
Ortlepp, I (通讯作者),Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, Gustav Kirchhoff Str 1, D-98693 Ilmenau, Germany.;Ortlepp, I (通讯作者),Tech Univ Ilmenau, Microsyst Technol Grp, Max Planck Ring 12, D-98693 Ilmenau, Germany.
NOVEL PATTERNING TECHNOLOGIES 2022, 2022; 12054 ():