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Effects of temperature, mechanical motion and source positional jitter on the resolving power of beamline 02B at the SSRF

Guo, Z; Meng, XY; Wang, Y; Liu, HG; Zhang, XZ; Li, ZL; Xue, L; Tai, RZ

Wang, Y; Liu, HG; Tai, RZ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, 239 Zhangheng Rd, Shanghai, Peoples R China.

JOURNAL OF SYNCHROTRON RADIATION, 2017; 24 ( ): 877

Abstract

A detailed analysis of the effects of temperature excursions, instrumental mechanical motion and source position jitter on the energy-resolving power ......

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