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Analog Circuit Fault Diagnosis Based on Support Vector Machine Classifier and Fuzzy Feature Selection

Liang, H; Zhu, YM; Zhang, DY; Chang, L; Lu, YM; Zhao, XF; Guo, Y

Guo, Y (corresponding author), Nanjing Univ Sci & Technol, Sch Automat, Nanjing 210094, Peoples R China.

ELECTRONICS, 2021; 10 (12):

Abstract

In analog circuit, the component parameters have tolerances and the fault component parameters present a wide distribution, which brings obstacle to c......

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