Abstract
Han, SM; He, YS; Huang, PH; Zheng, SQ; Zhou, M; Wang, FZ
He, YS (通讯作者),Henan Polytech Univ, Sch Elect Engn & Automat, Jiaozuo 454000, Henan, Peoples R China.
MICROELECTRONICS RELIABILITY, 2022; 128 ():