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A Novel Technique to Suppress Multiple-Triggering Effect in Typical DTSCRs under ESD Stress

Zhang, LZ; Wang, Y; He, YD

Wang, Y (corresponding author), Peking Univ, Inst Microelect, Key Lab Microelect Device & Circuits MoE, Beijing 100871, Peoples R China.

IEICE TRANSACTIONS ON ELECTRONICS, 2020; E103C (5): 274

Abstract

This work reports a new technique to suppress the undesirable multiple-triggering effect in the typical diode triggered silicon controlled rectifier (......

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