Baidu
map

Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors

Zhang, X; Li, YD; Wen, L; Feng, J; Zhou, D; Cai, YL; Liu, BK; Fu, J; Guo, Q

Li, YD (corresponding author), Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China.

JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020; 57 (9): 1015

Abstract

BackSide-Illuminated (BSI) CMOS Image Sensors (CISs), with developed performance on quantum efficiency and sensitivity, have been applied for aerospac......

Full Text Link


Baidu
map
Baidu
map
Baidu
map